Nondestructive method of thin-film dielectric constant measurements by two-wire capacitor
نویسندگان
چکیده
منابع مشابه
Nondestructive Readout Scheme for Thin Film Memories
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ژورنال
عنوان ژورنال: physica status solidi (b)
سال: 2016
ISSN: 0370-1972
DOI: 10.1002/pssb.201600476